This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.

Search for Publication

Year(s) from:  to 
Keywords (separated by spaces):

Multiresolution Analysis of DEMs: Error and Artifact Characterization

D. Luca, M. Datcu and K. Seidel


Digital elevation data is often affected by errors due to excessive interpolation or to interferometric artifacts. The local analysis of the DEM roughness allows both the detection of these errors and the segmentation of the elevation data for a better understanding of the existing geological structures. This analysis can be performed by means of fractal dimension estimators. We compare several fractal estimation methods and show that those based on the multiresolution (wavelet) data analysis yield the best results from the point of view of their segmentation capabilities. This is a natural conclusion considering that fractals and wavelets rely on many common concepts. As an example we show an application in which SAR intereferometric artifacts are revealed and the elevation data is separated in different roughness classes using fractal dimension measurements and an unsupervised clustering algorithm.

Download in pdf format
  author = {D. Luca and M. Datcu and K. Seidel},
  title = {Multiresolution Analysis of DEMs: Error and Artifact Characterization},
  booktitle = {FRINGE},
  year = {1996},
  pages = {61-68},
  editor = {T.-D. Guyenne and D. Danesy},
  series = {ESA SP-406},
  keywords = {remote sensing, measurement, model-based, DEM/DTM, fractal, wavelets}